Momo Arorau: Crystal Oscillator Driver, Ngaohiko Tuku: 1.65V ~ 5.5V, Tuhinga o mua: 1, Temperature Whakahaere: -40°C ~ 125°C (TA), Momo Whakauru: Surface Mount, Mōkihi / Take: SOT-23-6,
Momo Arorau: IEEE STD 1284 Translation Transceiver, Ngaohiko Tuku: 3V ~ 3.6V, Tuhinga o mua: 19, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 48-TFSOP (0.240", 6.10mm Width),
Momo Arorau: Crystal Oscillator Driver, Ngaohiko Tuku: 1.65V ~ 5.5V, Tuhinga o mua: 1, Temperature Whakahaere: -40°C ~ 125°C (TA), Momo Whakauru: Surface Mount, Mōkihi / Take: 6-TSSOP, SC-88, SOT-363,
Momo Arorau: ABT Scan Test Device With Universal Bus Transceivers, Ngaohiko Tuku: 2.7V ~ 3.6V, Tuhinga o mua: 18, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 64-TFSOP (0.240", 6.10mm Width),
Momo Arorau: Arithmetic Logic Unit, Ngaohiko Tuku: 4.75V ~ 5.25V, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Through Hole, Mōkihi / Take: 24-DIP (0.600", 15.24mm),
Momo Arorau: Scan Test Device with Buffers, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 8, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 24-SOIC (0.295", 7.50mm Width),
Momo Arorau: TTL/BTL Transceiver/Translator, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 7, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 52-QFP,
Momo Arorau: Addressable Scan Ports, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 10, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 24-TSSOP (0.173", 4.40mm Width),
Momo Arorau: Scan Test Device with Registered Bus Transceiver, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 8, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 28-SOIC (0.295", 7.50mm Width),
Momo Arorau: Digital Phase-Locked-Loop Filters, Ngaohiko Tuku: 4.75V ~ 5.25V, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Through Hole, Mōkihi / Take: 16-DIP (0.300", 7.62mm),
Momo Arorau: ABT Scan Test Device With Transceivers and Registers, Ngaohiko Tuku: 2.7V ~ 3.6V, Tuhinga o mua: 18, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 64-LQFP,
Momo Arorau: Schottky Barrier Diode Bus-Termination Array, Tuhinga o mua: 16, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 20-SOIC (0.295", 7.50mm Width),
Momo Arorau: TTL/BTL Transceiver/Translator, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 9, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 52-QFP,
Momo Arorau: 4-TO-1 Multiplexed/Demultiplexed Transceivers, Ngaohiko Tuku: 4.75V ~ 5.5V, Tuhinga o mua: 5, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 56-BSSOP (0.295", 7.50mm Width),
Momo Arorau: LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver, Ngaohiko Tuku: 3.15V ~ 3.45V, Tuhinga o mua: 8, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 48-TFSOP (0.240", 6.10mm Width),
Momo Arorau: Scan Test Device with Bus Transceiver and Registers, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 8, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 28-BSSOP (0.295", 7.50mm Width),
Momo Arorau: Arithmetic Logic Unit, Ngaohiko Tuku: 4.5V ~ 5.5V, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 24-SOIC (0.295", 7.50mm Width),
Momo Arorau: Binary Full Adder with Fast Carry, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 4, Temperature Whakahaere: -55°C ~ 125°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 16-SOIC (0.154", 3.90mm Width),
Momo Arorau: Registered Buffer with SSTL_2 Compatible I/O for DDR, Ngaohiko Tuku: 2.3V ~ 2.7V, Tuhinga o mua: 26, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 96-LFBGA,
Momo Arorau: Crystal Oscillator Driver, Ngaohiko Tuku: 1.65V ~ 5.5V, Tuhinga o mua: 1, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 8-XFBGA, DSBGA,
Momo Arorau: 1:1, 1:2 Configurable Registered Buffer, Ngaohiko Tuku: 1.7V ~ 1.9V, Tuhinga o mua: 25, 14, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 96-LFBGA,
Momo Arorau: Delay Element, Ngaohiko Tuku: 4.75V ~ 5.25V, Tuhinga o mua: 6, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 16-SOIC (0.154", 3.90mm Width),
Momo Arorau: Registered Buffer with SSTL_2 Compatible I/O for DDR, Ngaohiko Tuku: 2.3V ~ 2.7V, Tuhinga o mua: 14, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 48-TFSOP (0.173", 4.40mm Width),
Momo Arorau: Scan Test Device with Bus Transceivers, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 8, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Through Hole, Mōkihi / Take: 24-DIP (0.300", 7.62mm),
Momo Arorau: Scan Test Device with Registered Bus Transceiver, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 18, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 64-LQFP,
Momo Arorau: LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver, Ngaohiko Tuku: 3.15V ~ 3.45V, Tuhinga o mua: 8, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 48-TFSOP (0.173", 4.40mm Width),
Momo Arorau: TTL/BTL Registered Transceiver, Ngaohiko Tuku: 4.75V ~ 5.25V, Tuhinga o mua: 8, Temperature Whakahaere: 0°C ~ 70°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 52-QFP,
Momo Arorau: Scan Test Device with Universal Bus Transceivers, Ngaohiko Tuku: 4.5V ~ 5.5V, Tuhinga o mua: 20, Temperature Whakahaere: -40°C ~ 85°C, Momo Whakauru: Surface Mount, Mōkihi / Take: 64-LQFP,
Momo Arorau: Arithmetic Logic Unit, Ngaohiko Tuku: 4.5V ~ 5.5V, Temperature Whakahaere: -55°C ~ 125°C, Momo Whakauru: Through Hole, Mōkihi / Take: 24-CDIP (0.600", 15.24mm),
